Patent · US Expired

Modular test instrument

US6738454B2 · kind B2 · utility

22Cited by
46References
26Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 24, 2003
Grant dateMay 18, 2004
Priority date
Expiry dateFeb 24, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH04M1/24
  • WIPO fieldTelecommunications
  • WIPO sectorElectrical engineering

Abstract

A method for testing various types of devices or systems employs a modular test instrument comprising a base unit and one of a selection of application modules, neither being capable of performing end-user functions without the other. When physically assembled to one another, the base unit and application module comprise a structurally unitary device specialized for performance of application-specific end-user functions. The base unit is generic to all types of test to be provided, and comprises a display, a power supply, a user interface, and generic software to operate the display and user interface. Each application module is connected to the base unit in the same manner, so that the same base unit can be employed with a wide variety of application modules. The application modules can be readily and conveniently removed from and assembled to the base unit. The application-specific application modules each include a physical interface for establishing signal-communicating connection to the device or system to be tested, and application-specific program data and software, including information required to provide appropriate test signals, test messages, and the like. Each applicat…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.