Integrated circuit including a test signal generator
US6738940B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 26, 2000 |
| Grant date | May 18, 2004 |
| Priority date | — |
| Expiry date | Dec 26, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2884
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An integrated circuit (IC) includes a first lead, a second lead and a sensor element that provides a sensed signal. The IC also includes a test signal generator that provides a test signal, a signal processing unit, and a switching device that selectively applies the sensed signal or the test signal to the signal processing unit in response to a command signal, wherein the signal processing unit provides processed data. In response to a test command input signal, the IC generates the command signal, wherein when the test input signal is active the command signal is set to command the switching device to input the test signal to the signal processing unit. A check sum calculator receives the processed data and provides a signal indicative of a check sum value on the second lead when the command signal is set to command the switching device to input the test signal to the signal processing unit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.