Patent · US Expired

Micromechanical structure, in particular for an acceleration sensor or yaw rate sensor and a corresponding method for producing the same

US6739193B2 · kind B2 · utility

3Cited by
4References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 28, 2002
Grant dateMay 25, 2004
Priority date
Expiry dateOct 28, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01P2015/0831
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A micromechanical structure and a corresponding manufacturing method. The structure includes a substrate, which includes an anchoring device, and a centrifugal mass, which is connected to the anchoring device via a flexible spring device, so that the centrifugal mass is elastically deflectable from its rest position. The centrifugal mass includes clearances and is configured to be deflectable by etching a sacrificial layer underneath it. The sacrificial layer is present in a first area located underneath the centrifugal mass with a first etchable thickness, and in a second area located underneath the centrifugal mass with a second etchable thickness, the second thickness is greater than the first thickness. The centrifugal mass is structured in the first area so that in etching only a maximum of two etching fronts may come together in order to limit the etching residue deposits.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.