X-ray system alignment method and apparatus
US6739751B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Apr 10, 2001 |
| Grant date | May 25, 2004 |
| Priority date | — |
| Expiry date | Jun 21, 2021 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B6/08
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
An x-ray alignment and measurement process including an x-ray source and a detection array. The detection array allows for the taking of images having a precisely known pixel size and location. Disposed between the x-ray source and the detection array is an object having a known size or position. The object is then imaged and the location and size of the object on the image can be determined and compared to the actual size or location. The calculation is performed on the multiple pixels in the image to mathematically determine the remaining unknown object location or size. For alignment purposes, any error in the location or size of the object can thus be corrected.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.