Patent · US Expired

Method for the analysis of gaseous components and test kit, in particular test kit for the implementation of this method

US6740294B2 · kind B2 · utility

4Cited by

8References

24Claims

0Family size

Assignee

Macherey, Nagel GmbH & Co. · DE

Inventors

Edmund Radmacher · Düren, DE
Klaus Moller · Mutterstadt, DE
Fritz Niendieck · Aachen, DE

Key dates

Filing date	Apr 16, 2001
Grant date	May 25, 2004
Priority date	—
Expiry date	May 7, 2022

Classification

Technology area (CPC Y)Emerging Cross-Sectional Technologies
CPC primaryY10T436/255
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The present invention relates to a method for the analysis of a gaseous component or of a component that can be transformed into gaseous form (23) of a sample (5) which provides that the sample (5) is filled into a sample receptacle (2) through a receptacle opening (4), and an analysis receptacle (7), which was previously supplied with a tracer reagent, is then by way of its receptacle opening (4) connected with the receptacle opening (4) of sample receptacle (2) via an adapter (10), after which step the component (23) is expelled from the sample receptacle (2) and into the analysis receptacle (7) wherein the analysis receptacle (7) is connected with the outside atmosphere in such a manner that a pressure compensation can take place.The invention further relates to a test kit, in particular, a test kit for implementing the method.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.