System and process for exploiting a test
US6741071B2 · kind B2 · utility
1Cited by
6References
6Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 8, 2000 |
| Grant date | May 25, 2004 |
| Priority date | — |
| Expiry date | Mar 21, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01M15/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The test rig of a machine (1) includes a distributed exploitation of the test results, where the signals originating from the sensors (2) are ordered into a single signal, passing through a broad pass-band cable (6), via a common acquisition module (5). The computers (11, 12, 13) in association with miscellaneous display means (7, 8, 9, 10) search for the measurements which interest them on pre-set frames of the signal by using lists of relations contained in a host computer (12).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.