Patent · US Expired

Method for detecting fluorescence phenomena in microscope

US6741346B1 · kind B1 · utility

15Cited by
5References
38Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 21, 2001
Grant dateMay 25, 2004
Priority date
Expiry dateJun 3, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N21/6408
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Process for detecting the phenomenon of fluorescence in a microscope, wherein the sample is irradiated by a modulated and/or pulsed laser light source, and the fluorescence is detected at least in two different phase positions of the detector.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.