System and method for electronically evaluating predicted fabric qualities
US6741726B1 · kind B1 · utility
10Cited by
7References
31Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 6, 2000 |
| Grant date | May 25, 2004 |
| Priority date | — |
| Expiry date | Mar 8, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N33/367
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system or method for electronically simulating fabrics to assist in grading yarn and fabric qualities, in which the diameter or other qualities of one or more yarn samples along the total length of the samples is measured, and representations of the measured yarn qualities are evaluated in a fabric pattern to assist evaluation of the effects of the yarn quality variations on fabric which potentially would be produced from the sampled yarn.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.