Systems and methods for facilitating automated test equipment functionality within integrated circuits

US6741946B2 · kind B2 · utility

Assignee

• AGILENT TECHNOLOGIES, INC. · US

Inventors

• John G. Rohrbaugh · Fort Collins, US
• Jeffrey R. Rearick · Fort Collins, US
• Shad Shepston · Firestone, US

Key dates

• Filing date: Mar 7, 2003
• Grant date: May 25, 2004
• Expiry date: Mar 7, 2023

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/3187
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A preferred system for facilitating automated test equipment functionality within integrated circuits includes automated test equipment (ATE) configured to electrically interconnect with an integrated circuit and to provide at least one signal to the integrated circuit. A first parametric test circuit, internal to the integrated circuit, also is provided. The first parametric test circuit is adapted to electrically communicate with the automated test equipment so that, in response to receiving a signal from the automated test equipment, the first parametric test circuit measures at least one parameter of a first pad of the integrated circuit.