Patent · US Expired

Method for combined fabrication of indium gallium arsenide/indium phosphide avalanche photodiodes and P-I-N photodiodes

US6743657B2 · kind B2 · utility

7Cited by
5References
20Claims
0Family size

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Inventors

Key dates

Filing dateMar 24, 2003
Grant dateJun 1, 2004
Priority date
Expiry dateMar 24, 2023

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY02E10/548

Abstract

An Indium/Gallium/Arsenide (InGaAs) detector having avalanche photodiodes (APD's) and p-i-n photodiodes on a single chip is provided. A method of fabricating the InGaAs device is also provided. The bias on the APD and p-i-n photodiodes are separately controlled.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.