Electrical probe
US6744246B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 29, 2002 |
| Grant date | Jun 1, 2004 |
| Priority date | — |
| Expiry date | Mar 29, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/067
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An electrical probe for a flying leadset of a logic analyzer probe has coaxially aligned internal elements enclosed in an insulating cover. The probe has an electrically conductive contact having contact fingers extending in one direction from a support member and a contact member extending in the opposite direction. A sleeve abuts the contact member and receive a center conductor of a conductive cable that is secured in the contact member. The insulating cover has a contact cover portion and a over-mold portion that are chemically bonded together. The contact fingers are positioned in the contact cover and the over-mold portion encapsulates the rest of the probe. The contact fingers are aligned parallel with one side of a square aperture formed in the contact cover. A resistive element may be interposed between the contact member and the sleeve.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.