Patent · US Expired

Methods and systems for enhanced automated system testing

US6745145B2 · kind B2 · utility

4Cited by
8References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 24, 2002
Grant dateJun 1, 2004
Priority date
Expiry dateAug 20, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/318314
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Electrical components and associated processes for enhancing automated test of a system by permitting automated generation and application (injection) of real-world stimuli applied to the system under test without the need for manual intervention. Electrical components of the present invention intercede in the exchange of signals and power over various signaling paths within a system under test. Under programmable control by methods of the invention, the electrical components of the present invention may simulate any desired real-world stimulus on any signal path associated with the system under test. Automated test procedures associated with the electrical components may then automate all phases of a test procedure including setup of the test environment, application of real-world stimuli, verification of operation of the system under test and cleanup and recovery following performance of the automated test sequence.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.