Patent · US Expired

Device for evaluating diffractive authenticity features

US6750465B2 · kind B2 · utility

2Cited by
9References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 25, 2002
Grant dateJun 15, 2004
Priority date
Expiry dateDec 7, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03H1/0011
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An apparatus for evaluating distinguishing authenticity features comprising diffraction elements on a document which is illuminated by an illumination source. The distinguishing authenticity element which is to be examined, diffracts the beam of the illuminating source and projects it onto an evaluating unit in the device. In order to be independent of the nature and location of the diffraction pattern, the diffraction pattern derived from the document to be examined is projected onto a screen and the image of the pattern recorded and evaluated by a camera (matrix or cells).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.