Three-dimensional shape measuring method
US6750975B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 27, 2001 |
| Grant date | Jun 15, 2004 |
| Priority date | — |
| Expiry date | Dec 7, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T7/521
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A three-dimensional shape measuring method by which measurement of a three-dimensional shape is realized with an improved precision. Grid patterns comprising a plurality of one-dimensional grids 1, 2 and 3, each having a period and direction different from those of the others, are simultaneously projected upon objects to be measured, using different colors for each of the one-dimensional grids 1, 2 and 3. Subsequently, a grid image deformed in accordance with the three-dimensional shapes of the objects to be measured is imaged, the grid image is separated by colors into one-dimensional grid components of each color, a phase for each of the one-dimensional grid components is detected, and then, measurement values of the three-dimensional shapes are obtained on the basis of the detected phases. At the same time, by imaging the objects to be measured by use of white light, color information on the objects to be measured are measured as well.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.