X-ray diagnostic apparatus
US6751289B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 9, 2001 |
| Grant date | Jun 15, 2004 |
| Priority date | — |
| Expiry date | Oct 9, 2021 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N25/30
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
When X -ray irradiation is performed with many X doses and the fall of temporary sensibility or the rise of the temporary offset arises, it is the X-ray diagnostic equipment which computes the correction by sensitiveness multiplier based on the sensibility characteristic or offset characteristic of each pixel, and rectifies data. In this X-ray diagnostic equipment, the correction by sensitiveness multiplier for data correction is determined based on the signal value detected last time at least. In integrating this correction by sensitiveness value from each pixel to the output signal, the influence by the fall of temporary sensibility or the rise of the temporary offset is removed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.