Patent · US Expired

Technique and system for measuring a characteristic in a subterranean well

US6751556B2 · kind B2 · utility

40Cited by
28References
50Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 12, 2002
Grant dateJun 15, 2004
Priority date
Expiry dateDec 12, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01K15/002
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A technique usable with a subterranean well includes deploying a first optical sensor downhole in the subterranean well. The technique includes observing an intensity of backscattered light from the first optical sensor to measure a distribution of a characteristic along a portion of the well. The technique includes deploying a second sensor downhole to measure the characteristic at discreet points within the portion. The second sensor is separate from this first sensor and includes at least one interferometric sensor.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.