Technique and system for measuring a characteristic in a subterranean well
US6751556B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 12, 2002 |
| Grant date | Jun 15, 2004 |
| Priority date | — |
| Expiry date | Dec 12, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01K15/002
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A technique usable with a subterranean well includes deploying a first optical sensor downhole in the subterranean well. The technique includes observing an intensity of backscattered light from the first optical sensor to measure a distribution of a characteristic along a portion of the well. The technique includes deploying a second sensor downhole to measure the characteristic at discreet points within the portion. The second sensor is separate from this first sensor and includes at least one interferometric sensor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.