Measuring and/or calibrating a test head
US6756778B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Oct 18, 2002 |
| Grant date | Jun 29, 2004 |
| Priority date | — |
| Expiry date | Oct 18, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2887
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A device for calibrating a test head of a testing device, where the test head has multiple electric contacts which are positioned in a contact region, has a contacting unit, which is dockable on the test head such that the contacting unit covers the contact region of the test head. The contacting unit includes a contact head, which has at least one measuring contact for contacting the contacts of the test head and is multi-dimensionally movable within the contacting unit using a positioning unit such that the contact head may approach and contact at least multiple contacts of the contact region. The device also has a control unit, which operates the positioning unit in calibration operation such that multiple or all contacts of the contact region to be contacted for calibrating the test head are automatically approached and contacted by the contacting head.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.