Semiconductor test system with easily changed interface unit
US6756800B2 · kind B2 · utility
6Cited by
12References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 17, 2002 |
| Grant date | Jun 29, 2004 |
| Priority date | — |
| Expiry date | Jun 17, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2851
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A subassembly to aid in changing the interface unit for an automatic test system. The disclosed embodiment shows an automatic test system with a handler and a tester. The interface unit is a device interface board (DIB). The subassembly allows the DIB to be easily accessed, yet can be properly aligned to the test system. No special tools are required to change the DIB.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.