Patent · US Expired

Thermal imaging system for detecting defects

US6759659B2 · kind B2 · utility

27Cited by
23References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 3, 2003
Grant dateJul 6, 2004
Priority date
Expiry dateJun 3, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2291/2694
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A thermal imaging system for detecting cracks and defects in a structure. An ultrasonic transducer is coupled to the structure through a malleable coupler. Ultrasonic energy from the transducer causes the defects to heat up, which is detected by a thermal camera. A control unit is employed to provide timing and control for the operation of the ultrasonic transducer and the camera.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.