System and method for non-contact electrical testing employing a CAM derived reference
US6759850B2 · kind B2 · utility
21Cited by
8References
38Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 27, 2002 |
| Grant date | Jul 6, 2004 |
| Priority date | — |
| Expiry date | Apr 9, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/304
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system and method for electrically testing electrical circuits in which electromagnetic values that are to be sensed by an array of sensors are forecast or simulated, for use as a reference, by calculation using computer files corresponding to a board under test and to an array of sensors.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.