Wavelength correction method and apparatus, wavelength check method and apparatus, arrayed waveguide diffraction grating, and interleaver
US6760521B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | May 13, 2002 |
| Grant date | Jul 6, 2004 |
| Priority date | — |
| Expiry date | May 13, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B6/12033
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
According to this invention, there are provided a wavelength correction method and apparatus which can easily correct the wavelength characteristics of an optical element such as an arrayed waveguide diffraction grating in a slab waveguide or another waveguide, and a wavelength check method and apparatus which check the quality of a waveguide. A center wavelength &lgr;0 of light having a predetermined wavelength &lgr;, emitted from a light source, is obtained at the initial position of an input-side slab waveguide which is cut into a first input-side waveguide component and a second input-side waveguide component. When a light component having a first wavelength &lgr;s on the short wavelength side and a light component having a second wavelength &lgr;1 on the long wavelength side, centered on a desired wavelength &lgr;g, are sequentially output from the light source, the amount of each light component is measured while the relative position of the input-side slab waveguide is changed. The positional relationship between the first and second input-side waveguide components is fixed to the relative position of the two components at which the levels of light components from them coinc…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.