Systems and methods for facilitating driver strength testing of integrated circuits
US6762614B2 · kind B2 · utility
16Cited by
13References
9Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 18, 2002 |
| Grant date | Jul 13, 2004 |
| Priority date | — |
| Expiry date | Apr 18, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/022
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Integrated circuits (ICs) are provided. A representative IC includes a first pad that incorporates a first driver and a first receiver, with the first driver being configured to provide a first pad output signal to a component external to the IC, and the first receiver being configured to receive a first pad input signal from a component external to the IC. A first test circuit also is provided that is internal to the IC. The first test circuit is adapted to provide information corresponding to the driver strength of the first pad. Systems, methods, computer-readable media and other ICs also are provided.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.