Patent · US Expired

Evaluation of burst test results

US6763728B1 · kind B1 · utility

10Cited by
4References
34Claims
0Family size

Assignee

Inventor

Key dates

Filing dateOct 26, 2000
Grant dateJul 20, 2004
Priority date
Expiry dateMar 22, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2203/0091
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for evaluating a seal on a package is disclosed. The method includes determining the value of a burst test force parameter. The burst test force parameter being a parameter that results from a force placed on the package during a burst test. The method also includes using the value of the burst test force parameter to determine a value of a peel test force parameter for the package. The peel test force parameter being a parameter that results from a force placed on the package during a peel test.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.