Lens inspection
US6765661B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 6, 2002 |
| Grant date | Jul 20, 2004 |
| Priority date | — |
| Expiry date | Aug 14, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/958
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention enables more objective defect evaluation of ophthalmic lenses, especially contact lenses, to take place through the combination of the schlieren method with the transmitted light method, with the result that the advantages of these two different systems are combined. The schlieren method is in a position to illustrate the edge of a contact lens and its ruptures, in high contrast, for the CCD camera. Likewise, tears and surface defects can be made visible. Using the transmitted light method, the bubbles may be suitably prepared for the camera.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.