Patent · US Expired

Methods of testing and manufacturing micro-electrical mechanical mirrors

US6765680B2 · kind B2 · utility

23Cited by
1References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 21, 2002
Grant dateJul 20, 2004
Priority date
Expiry dateJan 4, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG02B26/0841
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The present invention provides a method of testing micro-electrical mechanical mirrors including simultaneously applying a voltage to each of a plurality of such mirrors to tilt each of the plurality to a deflection angle, and simultaneously deflecting a beam from each of the plurality using an interferometer to simultaneously determine an accuracy of the deflection angle of each of the plurality. In addition, a method of manufacturing micro-electrical mechanical mirrors is also disclosed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.