Patent · US Expired

Defect inspection method for three-dimensional object

US6766047B2 · kind B2 · utility

3Cited by
3References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 5, 2001
Grant dateJul 20, 2004
Priority date
Expiry dateJul 3, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N21/8851
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A defect inspection method for three-dimensional shapes employs a difference is between a distance code obtained by scanning, a perfect work (a value indicating a rocking angle of a mirror), and a distance code obtained by scanning an inspected work, at each measurement position. Differences are stored for a matrix in which a linear direction of the irradiation and a direction of a moving locus of the irradiation are two orthogonal axes. The most frequent difference value among matrix elements in the linear direction of the irradiation is found at each rocking angle of the mirror. A matrix element having a difference that deviates from the most frequent difference value by more than a set value is found at each rocking position of the mirror. Thus, sections having distance codes that do not match distance codes of the perfect work even by relatively shifting the distance code data are detected and identified as defect candidates. The presence/absence of defects on the inspected work is determined on the basis of all the existing states of matrix elements as defect candidates.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.