Patent · US Expired

Image pattern detection method and apparatus

US6766056B1 · kind B1 · utility

41Cited by
5References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 30, 1999
Grant dateJul 20, 2004
Priority date
Expiry dateNov 30, 2019

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06V10/44
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Disclosed is method of detecting a predetermined mark (30) forming part of an image. A digitized form (48, 49) of the image (21) comprising a plurality of picture elements is provided and within a current region of the image a set of features is determined. The features typically comprise a dominant color feature (44) within the current region; and at least one moment feature (111) based on picture elements pertaining to the predetermined mark within the current region. Each determined feature is compared (113) with a corresponding predetermined feature (114) of the predetermined mark. Using the comparison, a confidence level for a detection of said predetermined mark within the current region calculated. Based on the confidence level, whether or not said predetermined mark is detected in the current region can then be determined. Adjunct to the above method, also disclosed are methods for providing multiple encoded representations (40) of the image, detecting a center location (108, 160) of a predetermined pattern in the image, and determining (170, 171) a moment feature of a portion of the image.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.