Patent · US Expired

Method for fabricating an isolated microelectromechanical system (MEMS) device incorporating a wafer level cap

US6768628B2 · kind B2 · utility

35Cited by
70References
80Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 26, 2001
Grant dateJul 27, 2004
Priority date
Expiry dateApr 26, 2021

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB81C2203/0109
  • WIPO fieldMicro-structural and nano-technology
  • WIPO sectorChemistry

Abstract

A MEMS structure is provided having a cap that encapsulates and protects the fragile components of the device, while having an electrical trace embedded in a nonconductive substrate. The electrical trace includes a first terminal end that is exposed to the peripheral region of the device, and a second end that is connected to the MEMS structure to facilitate operation of the device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.