Patent · US Expired

Method and system for extracting data from surface array deposited features

US6768820B1 · kind B1 · utility

19Cited by
9References
5Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 11, 2000
Grant dateJul 27, 2004
Priority date
Expiry dateJul 21, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T2207/30072
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method for evaluating an orientation of a molecular array having features arranged in a pattern. An image of the molecular array is obtained by scanning the molecular array to determine data signals emanating from discrete positions on a surface of the molecular array. An actual result of a function on pixels of the image which pixels lie in a second pattern, is calculated. This actual result is compared with an expected result which would be obtained if the second pattern had a predetermined orientation on the array. Array orientation can then be evaluated based on the result.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.