Method and system for processing measurement signals to obtain a value for a physical parameter
US6769307B1 · kind B1 · utility
24Cited by
31References
48Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 20, 2000 |
| Grant date | Aug 3, 2004 |
| Priority date | — |
| Expiry date | Jul 28, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2291/101
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In a measurement system wherein time-varying physical signals containing frequency information related to a physical parameter of an object are measured to obtain corresponding time-varying measurement signals, a method and system are disclosed for processing the measurement signals to obtain a value for the physical parameter by first extracting the frequency information from the measurement signals. The frequency information includes at least one desired frequency. The physical signals are electromagnetic signals. The object is a film such as a layer formed on a substrate, the physical parameter may be thickness of the layer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.