Method of automatic standardized calibration for infrared sensing device
US6770869B2 · kind B2 · utility
53Cited by
36References
4Claims
0Family size
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Key dates
| Filing date | Aug 28, 2003 |
| Grant date | Aug 3, 2004 |
| Priority date | — |
| Expiry date | Aug 28, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG08C2201/42
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
A method for calibrating automatic infrared sensing devices having control modules, an IR detector, and an IR emitter by using a select infrared emitter/detector pair to calibrate a plurality of control modules wherein an appropriate infrared emitter input value to the select infrared emitter is obtained to provide a given output from the select infrared detector in response to infrared radiation reflected from a known test object, and the appropriate infrared emitter input value is then determined and stored permanently in one or more control modules as a calibration standard.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.