Patent · US Expired

Quality control of data

US6772068B2 · kind B2 · utility

2Cited by
1References
18Claims
0Family size

Inventor

Key dates

Filing dateDec 13, 2002
Grant dateAug 3, 2004
Priority date—
Expiry dateDec 13, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01V2210/34
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method of monitoring the quality of data is disclosed. The method includes sampling a first acquired data trace to determine the amplitude of the trace at a plurality of sampling times; and determining first and second attributes for the acquired first data trace from the sampled amplitudes of the first acquired data trace, the first and second attributes being indicative of the noise content of the first acquired data trace.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.