Patent · US Expired

In-situ purge system for article containers

US6772805B2 · kind B2 · utility

3Cited by
3References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 22, 2002
Grant dateAug 10, 2004
Priority date
Expiry dateNov 22, 2022

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/67772
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

An in-situ purge system for charging the interior of a semiconductor wafer pod with nitrogen gas after the pod is exposed to ambient moisture, air and particles in a clean room. A gas supply line extends into the pod interior from a gas source, and a gas exhaust line extends from the pod interior to remove moisture, particles and excess gas from the pod interior as the pod contains a wafer-filled cassette and rests typically on a SMIF arm before transfer to a processing tool or other destination in the facility. The removable bottom door of the pod and the bottom plate of the cassette are modified to receive the gas supply line and the gas exhaust line.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.