Patent · US Expired

Method and apparatus for the multiplexed acquisition of a bare die from a wafer

US6773543B2 · kind B2 · utility

9Cited by
7References
10Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMay 6, 2003
Grant dateAug 10, 2004
Priority date
Expiry dateMay 6, 2023

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T156/1978
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method for the co-processing of bare die removal from a semiconductor wafer for the improved throughput of the extraction of die from a wafer for subsequent placement onto a substrate. The apparatus includes a pick head containing a nozzle having a suction port within that secures the bare die as it is removed from the wafer. The intermediate holding station has a plurality of nozzles, each having a vacuum port to secure and buffer a multitude of flipped die that are transferred from the pick nozzle. Vacuum flow valves enable the release and transfer of the bare die. Having a multiple of nozzles provides a buffer for the die as they are subsequently transitioned from the pick nozzle, queued within the intermediate transfer station and loaded in tandem onto a die shuttle.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.