Patent · US Expired

Blowable memory device and method of blowing such a memory

US6775175B2 · kind B2 · utility

3Cited by
6References
22Claims
0Family size

Assignee

Inventor

Key dates

Filing dateAug 30, 2002
Grant dateAug 10, 2004
Priority date
Expiry dateAug 30, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C17/18
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A memory device includes a plurality of memory cells arranged as a matrix. Each memory cell includes a transistor and a capacitor connected in series. Each memory cell is linked to a bit line that connects the memory cells of a column. Each memory cell is also linked to a word line and to a third line. A gate of the transistor of a memory cell is linked to the word line, with each word line being linked to the gates of the transistors in a respective column. A third line is linked to the sources of the transistors of a row of memory cells. A bit line is linked to the capacitors of the transistors of a column. The voltage between the gate and the source of a transistor can thus be controlled via the word column and the third line.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.