Patent · US Expired

Film deposition to enhance sealing yield of microcap wafer-level package with vias

US6777263B1 · kind B1 · utility

141Cited by
10References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 21, 2003
Grant dateAug 17, 2004
Priority date
Expiry dateAug 21, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/50
  • WIPO fieldMicro-structural and nano-technology
  • WIPO sectorChemistry

Abstract

A method for forming a wafer package includes forming a die structure, wherein the die structure includes a first wafer, a device mounted on the first wafer, a second wafer mounted atop the first wafer with a first seal ring around the device and a second seal ring around a via contact. The method further includes forming a trench in the second wafer around the first seal ring, filling the trench and the via contact with a sealing agent, patterning a topside of the second wafer to removed the excessive sealing agent and to expose a contact pad of the via contact, and singulating a die around the first seal ring.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.