Patent · US Expired

Semiconductor memory device and method of manufacturing the same

US6778424B2 · kind B2 · utility

57Cited by
4References
26Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 9, 2001
Grant dateAug 17, 2004
Priority date
Expiry dateDec 13, 2021

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10B12/01
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A semiconductor memory device having MIS transistors to constitute memory cells (MC), each of the MIS transistors including a semiconductor layer (12), a source region (15) formed in the semiconductor layer, a drain region (14) formed apart from the source region in the semiconductor layer, the semiconductor layer between the source region and the drain region serving as a channel body in a floating state, a main gate (13) provided between the source region and the drain region to form a channel in the channel body; and an auxiliary gate (20) provided separately from the main gate to control a potential of the channel body by capacitive coupling, the auxiliary gate being driven in synchronization with the main gate. The MIS transistor has a first data state in which the channel body is set at a first potential and a second data state in which the channel body is set at a second potential.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.