Patent · US Expired

Inspection method using penetrant and dielectrometer

US6781387B2 · kind B2 · utility

20Cited by
42References
4Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 20, 2002
Grant dateAug 24, 2004
Priority date
Expiry dateAug 20, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01V3/104
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Described is an inspection method for detecting defects in dielectic test materials using a penetrant material and a dielectric sensor. The penetrant material provides differing dielectric properties from test material and improves the dielectric contrast between defects substantially filled by the penetrant and the test material. The penetrant can be a liquid, such as water, or a powder, as long as it provides a substantially different complex permittivity than the test material.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.