Inspection method using penetrant and dielectrometer
US6781387B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 20, 2002 |
| Grant date | Aug 24, 2004 |
| Priority date | — |
| Expiry date | Aug 20, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V3/104
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Described is an inspection method for detecting defects in dielectic test materials using a penetrant material and a dielectric sensor. The penetrant material provides differing dielectric properties from test material and improves the dielectric contrast between defects substantially filled by the penetrant and the test material. The penetrant can be a liquid, such as water, or a powder, as long as it provides a substantially different complex permittivity than the test material.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.