Electro-optical para-axial distance measuring system
US6781675B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 13, 2003 |
| Grant date | Aug 24, 2004 |
| Priority date | — |
| Expiry date | Mar 13, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01S7/497
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An electro-optical distance measuring system (1, 1′) for large measurement ranges having a para-axial arrangement of a beam source (2) with a transmitting optics (3) and a beam receiver, configured as at least one small-area photodiode (4), with an associated receiving optics (5), which contains the processes for signal extension for the lower distance measurement range for distances (X). The beam source (2), the transmitting optics (3), the small-area photodiode (4) and the receiving optics (5) are each oriented with their optical axes (A1, A2) parallel to the measurement light beam (6). The measurement light beam (6) is directed from the transmitting optics (2) to the measurement object and continues to the receiving optics. The beam source (2) and the small-area photodiode (4) are connected rigidly with each other by at least one rigidly connected circuit board (8, 8a, 8b), such that at least the small-area photodiode (4) can electrically conduct and temporarily adjust in a position (9, 9′) at least using its electrical contacts (10). The small-area photodiode (4) is fixed directly in the adjusted position (9, 9′) on the circuit board (8, 8a, 8b).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.