Patent · US Expired

Electro-optical para-axial distance measuring system

US6781675B2 · kind B2 · utility

16Cited by
6References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 13, 2003
Grant dateAug 24, 2004
Priority date
Expiry dateMar 13, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01S7/497
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An electro-optical distance measuring system (1, 1′) for large measurement ranges having a para-axial arrangement of a beam source (2) with a transmitting optics (3) and a beam receiver, configured as at least one small-area photodiode (4), with an associated receiving optics (5), which contains the processes for signal extension for the lower distance measurement range for distances (X). The beam source (2), the transmitting optics (3), the small-area photodiode (4) and the receiving optics (5) are each oriented with their optical axes (A1, A2) parallel to the measurement light beam (6). The measurement light beam (6) is directed from the transmitting optics (2) to the measurement object and continues to the receiving optics. The beam source (2) and the small-area photodiode (4) are connected rigidly with each other by at least one rigidly connected circuit board (8, 8a, 8b), such that at least the small-area photodiode (4) can electrically conduct and temporarily adjust in a position (9, 9′) at least using its electrical contacts (10). The small-area photodiode (4) is fixed directly in the adjusted position (9, 9′) on the circuit board (8, 8a, 8b).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.