Quality review method for optical components using a fast system performance characterization
US6781698B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 9, 2002 |
| Grant date | Aug 24, 2004 |
| Priority date | — |
| Expiry date | Sep 9, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01M11/335
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for screening the quality of an optical component including the step of simulating the performance of the optical component. The step of simulating includes the step of measuring the optical phase &phgr; of the optical component, wherein the step of measuring comprises indirectly measuring the optical phase &phgr; of the optical component using a scanning laser having a scanning step size &Dgr;&ohgr; and a modulation frequency &ohgr;m such that &Dgr;&ohgr;/&ohgr;m≦2. The light throughput R of the optical component is then measured. A transfer function H as a function of optical frequency &ohgr; is constructed where H(&ohgr;)=R(&ohgr;)exp[j&phgr;(&ohgr;)], and the performance is simulated using the measured value of the optical phase and the light throughput into the transfer function.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.