Method and apparatus for measuring optical phase and amplitude
US6781701B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 5, 2002 |
| Grant date | Aug 24, 2004 |
| Priority date | — |
| Expiry date | Aug 26, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01M11/0292
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method, apparatus, and system for measuring optical phase and amplitude properties of an output optical field to characterize diffractive, refractive, and other optical elements to estimate, measure, and characterize an optical transfer function are disclosed herein. In a representative embodiment, a light source may generate an optical field incident to an optical element, such as a diffraction grating. An aperture plate may be positioned relative to the optical element to allow translation of at least one of the aperture plate or the optical element in a plane transverse to a surface normal of the optical element, resulting in an output optical field having spatially dependant amplitude and phase characteristics related to a position on the optical element and to the optical field incident to the optical element. The output optical field may then be detected and analyzed to characterize the optical transfer function of the optical element.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.