Patent · US Expired

Differential coaxial contact array for high-density, high-speed signals

US6784679B2 · kind B2 · utility

97Cited by
2References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 30, 2002
Grant dateAug 31, 2004
Priority date
Expiry dateNov 5, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R1/07314
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A probe tower for an automatic test system includes an insulative retainer for holding an array of differential probe assemblies. Each differential probe assembly is an elongated structure having first and second ends and first and second coaxial portions. Each coaxial portion includes an outer conductor and a pair of annular insulators positioned therein for holding a center conductor. First and second contact pins extend from the center conductor at the first and second ends, respectively. First and second ground pins, which are electrically connected to the outer conductors of the first and second coaxial portions, extend from the first and second ends for conveying ground connections.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.