Temperature measurement of an electronic device
US6786637B2 · kind B2 · utility
5Cited by
16References
15Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 13, 2002 |
| Grant date | Sep 7, 2004 |
| Priority date | — |
| Expiry date | Sep 13, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J5/0896
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The temperature of an electronic device at specified locations is determined by measuring the phonon frequency shift at the location of interest caused by operation of the device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.