Patent · US Expired

Temperature control of electronic devices using power following feedback

US6788084B2 · kind B2 · utility

11Cited by
75References
30Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 5, 2002
Grant dateSep 7, 2004
Priority date
Expiry dateSep 5, 2022

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A system and method for controlling a temperature of a device during testing with a thermal controller and a heat exchanger includes measuring an instantaneous power consumption of the device during testing. The heat exchanger is controlled with the thermal controller using the measured instantaneous power consumption by the device to regulate the temperature of the device during testing, wherein the heat exchanger is in conductive contact with the device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.