Drop quantity calibration method and system
US6789870B2 · kind B2 · utility
10Cited by
5References
26Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 24, 2002 |
| Grant date | Sep 14, 2004 |
| Priority date | — |
| Expiry date | May 24, 2022 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB41J29/393
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method and system for calibrating a device having a first fluid source that ejects a first drop quantity and a second fluid source that ejects a second drop quantity by, for example, printing a pattern having a first portion and a second portion; obtaining a relationship between the first drop quantity and the second drop quantity from the pattern; and adjusting data used to determine quantities of fluid to eject from the first or second fluid sources based on the relationship between the first and second drop quantities. Other embodiments of the invention are directed to a calibration apparatus and system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.