Scanning apparatus
US6791101B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jun 5, 2003 |
| Grant date | Sep 14, 2004 |
| Priority date | — |
| Expiry date | Jun 5, 2023 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N1/0678
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Methods and apparatus for directing radiation to and from a sample to be scanned. In one example, first radiation propagating along a first axis is reflected off of the first axis so as to impinge on the sample. In response to the first radiation, the sample emits second radiation, which is directed to a detector. In one aspect, the second radiation is received directly from the sample by a reflector, which reflects the second radiation such that it travels substantially through air to impinge on the detector. In another aspect, the second radiation is directed such that it travels toward the detector in a direction having a significant vector component parallel to the first axis. In yet another aspect, a detection surface of the detector is oriented essentially perpendicular to the first axis and adapted to detect at least some of the second radiation traveling in a direction non-parallel to the first axis.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.