Impedance mismatch apparatus and system for isolation of an MR imaging system
US6791325B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | May 28, 2003 |
| Grant date | Sep 14, 2004 |
| Priority date | — |
| Expiry date | May 28, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R33/3854
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An MR system isolation impedance mismatch apparatus (12) includes an impedance mismatch layer (24). The impedance mismatch layer (24) performs as a mechanical notch filter and isolates an MR system component (14) from a surrounding structure (18). A method of tuning the impedance mismatch apparatus (12) includes determining a default notch filter frequency range. The impedance mismatch apparatus (12) is formed and performs as a notch filter having the default notch filter frequency range. The impedance mismatch apparatus (12) is installed and tested between the MR system component (14) and the surrounding structure (18). Vibrations are detected in the MR system component (14) and in the surrounding structure (18). The impedance mismatch apparatus is adjusted in response to the detected vibrations.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.