Patent · US Expired

Single wafer type cleaning method and apparatus

US6792959B2 · kind B2 · utility

1Cited by
15References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 15, 2003
Grant dateSep 21, 2004
Priority date
Expiry dateMay 15, 2023

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S134/902
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A single wafer type wet-cleaning technique for wet-cleaning wafers, individually, which are not stored in a cassette, at the front and back faces thereof simultaneously, in a sealed cleaning housing, whereby a plurality of chemical fluids are vertically and sequentially supplied from a number of upper side supply nozzles 25 and lower side supply nozzles 26 to the front and back faces of each wafer W to clean the same, and purified water is always caused to flow out of the lower side supply nozzles 26, 26, . . . , which do not supply chemical fluids, of the lower side supply nozzles, thereby preventing the occurrence of cross contamination of various chemical fluids between cleaning treatments.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.