Focus inspection device and focusing method
US6795165B2 · kind B2 · utility
8Cited by
3References
21Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Mar 15, 2002 |
| Grant date | Sep 21, 2004 |
| Priority date | — |
| Expiry date | Jul 7, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B7/28
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A photographic lens and test chart provide for a method of inspecting and adjusting the focus of the lens. The test chart is obliquely inclined relative to a plane perpendicular to the viewing axis of the photographic lens. Test photographs are taken of the test chart under low magnification and high magnifications the test photographs enabling the photographic lens to be adjusted for proper focus.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.