Patent · US Expired

Method for forming gas cluster and method for forming thin film

US6797334B2 · kind B2 · utility

10Cited by
10References
14Claims
0Family size

Assignees

Inventors

Key dates

Filing dateAug 27, 2003
Grant dateSep 28, 2004
Priority date
Expiry dateAug 27, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J2237/0812
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

In order to deopsit a high-grade and extra-thin film without causing damage to the substrate at a relatively low temperature,the present invention provides a method for forming a cluster which is a lumpy group of atoms or molecules of a reactive substance at the room temperature under the atmospheric pressure, irradiating electrons onto clusters, irradiating the resulting cluster ions onto a substrate surface by accelerating by an acceleration voltage, and at the same time or alternately, irradiating one or more component gases of the deposit film onto the substrate surface, thereby depositing a thin film on the substrate surface through reaction.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.